- Concept UI
- M0026341
- Scope Note
- A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
- Terms
-
Microscopy, Electron, Scanning Transmission
Preferred Term
Term UI
T051870
Date01/01/1999
LexicalTag
NON
ThesaurusID
NLM (1993)
-
STEM
Term UI
T051867
Date02/25/1992
LexicalTag
ABB
ThesaurusID
NLM (1993)
-
Electron Microscopy, Scanning Transmission
Term UI
T051868
Date02/25/1992
LexicalTag
NON
ThesaurusID
NLM (1993)
-
Scanning Transmission Electron Microscopy
Term UI
T051869
Date02/25/1992
LexicalTag
NON
ThesaurusID
NLM (1993)