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Microscopy, Electron MeSH Descriptor Data 2023


MeSH Heading
Microscopy, Electron
Tree Number(s)
E01.370.350.515.402
E05.595.402
Unique ID
D008854
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D008854
Annotation
general or unspecified; prefer specifics
Scope Note
Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
Entry Term(s)
Electron Microscopy
Date Established
1966/01/01
Date of Entry
1999/01/01
Revision Date
2004/07/28
Microscopy, Electron Preferred
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