MeSH Browser

MeSH Heading: Electron Probe Microanalysis
Tree Number(s): E01.370.350.515.402.250; E05.196.867.800.360; E05.595.402.250; E05.799.830.360
Unique ID: D004577
RDF Unique Identifier: http://id.nlm.nih.gov/mesh/D004577
Scope Note: Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
Entry Version: ELECTRON PROBE MICROANAL
Entry Term(s): Microanalysis, Electron Probe; Microscopy, Electron, X-Ray Microanalysis; Spectrometry, X Ray Emission, Electron Microscopic; Spectrometry, X Ray Emission, Electron Probe; Spectrometry, X-Ray Emission, Electron Microscopic; Spectrometry, X-Ray Emission, Electron Probe; X Ray Emission Spectrometry, Electron Microscopic; X Ray Emission Spectrometry, Electron Probe; X-Ray Emission Spectrometry, Electron Microscopic; X-Ray Emission Spectrometry, Electron Probe; X-Ray Microanalysis; X-Ray Microanalysis, Electron Microscopic; X-Ray Microanalysis, Electron Probe
Previous Indexing: Electrons (1966); Spectrum Analysis (1966)
See Also: Nuclear Microscopy
Public MeSH Note: 70
History Note: 70(67)
Date Established: 1970/01/01
Date of Entry: 1999/01/01
Revision Date: 2012/07/03

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Electron Probe Microanalysis MeSH Descriptor Data 2025