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Volume Electron Microscopy MeSH Descriptor Data 2023


MeSH Heading
Volume Electron Microscopy
Tree Number(s)
E01.370.350.515.402.812
E05.595.402.812
L01.224.308.705
Unique ID
D000094443
RDF Unique Identifier
http://id.nlm.nih.gov/mesh/D000094443
Scope Note
Electron microscopy techniques designed to reconstruct 3-D images at micrometer volume scales at nanometer (nm) level resolutions. Volume electron microscopy uses various techniques to render, segment and reconstruct 3-D images from stacked sequential 2-D images of incremental z-planes.
Entry Term(s)
FIB-SEM
Focused Ion Beam SEM
Focused Ion Beam Scanning Electron Microscopy
SBF-SEM
Serial Block-Face SEM
Serial Block-Face Scanning Electron Microscopy
Serial Sectioning TEM
Serial Sectioning Transmission Electron Microscopy
Volume EM
ssTEM
vEM Volume Electron Microscopy
Previous Indexing
Microscopy, Electron (1983-2022)
Public MeSH Note
2023
History Note
2023
Date Established
2023/01/01
Date of Entry
2022/07/12
Revision Date
2022/07/12
Volume Electron Microscopy Preferred
Focused Ion Beam Scanning Electron Microscopy Narrower
Serial Sectioning Transmission Electron Microscopy Narrower
Serial Block-Face Scanning Electron Microscopy Narrower
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