MeSH Browser

MeSH Heading: Nuclear Microscopy
Tree Number(s): E01.370.350.515.744; E05.595.744
Unique ID: D062345
RDF Unique Identifier: http://id.nlm.nih.gov/mesh/D062345
Scope Note: A method of simultaneously imaging and measuring elements at the submicron level. Nuclear microscopy uses a focused high-energy ion beam of PROTONS and ALPHA PARTICLES (a nuclear microprobe) to interact with the sample. The resulting emitted radiations are analyzed by a group of techniques simultaneously: PARTICLE INDUCED X RAY EMISSION SPECTROMETRY for minor and trace element identification; Rutherford Backscattering Spectroscopy to assess sample thickness and bulk elements such as carbon, hydrogen, oxygen, and nitrogen; and Scanning Transmission Ion Microscopy to assess sample structure and density.
Entry Term(s): Nuclear Microscope Analysis; Scanning Nuclear Microprobe Analysis
See Also: Electron Probe Microanalysis
Public MeSH Note: 2013
History Note: 2013
Date Established: 2013/01/01
Date of Entry: 2012/07/03
Revision Date: 1955/01/01

Allowable Qualifiers: classification (CL)

economics (EC)

ethics (ES)

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instrumentation (IS)

methods (MT)

standards (ST)

statistics & numerical data (SN)

trends (TD)

veterinary (VE)

Concept UI: M0562610
Scope Note: A method of simultaneously imaging and measuring elements at the submicron level. Nuclear microscopy uses a focused high-energy ion beam of PROTONS and ALPHA PARTICLES (a nuclear microprobe) to interact with the sample. The resulting emitted radiations are analyzed by a group of techniques simultaneously: PARTICLE INDUCED X RAY EMISSION SPECTROMETRY for minor and trace element identification; Rutherford Backscattering Spectroscopy to assess sample thickness and bulk elements such as carbon, hydrogen, oxygen, and nitrogen; and Scanning Transmission Ion Microscopy to assess sample structure and density.
Terms: Nuclear Microscopy Preferred Term
Term UI T800436
Date11/10/2011
LexicalTag NON
ThesaurusID NLM (2013); Scanning Nuclear Microprobe Analysis
Term UI T812834
Date11/17/2011
LexicalTag NON
ThesaurusID NLM (2013); Nuclear Microscope Analysis
Term UI T812833
Date11/17/2011
LexicalTag NON
ThesaurusID NLM (2013)

Nuclear Microscopy MeSH Descriptor Data 2025